Re: [SI-LIST] : Measuring parasitic values

About this list Date view Thread view Subject view Author view

From: Barry Ma ([email protected])
Date: Wed Sep 20 2000 - 11:14:13 PDT

Thanks Michael for your nice explanation.

I just run into a reference:
Dascher, D., "Measuring Parasitic Capacitance and Inductance Using TDR" HP Journal, April 1996, Article 11.

The article is not available to me. That inspired me to ask a relevant question. Can anybody help me outlining the methodology used in the article?

Maybe I should have asked a general question: How to find and measure a suspicious connection inside a working transmission line? Or, how to check on a working transmission line system to see if any part gets loosened.

Best Regards,
Barry Ma
[email protected]

_______________________________________________________________________

Free Unlimited Internet Access! Try it now!
http://www.zdnet.com/downloads/altavista/index.html

_______________________________________________________________________

**** To unsubscribe from si-list or si-list-digest: send e-mail to
[email protected]. In the BODY of message put: UNSUBSCRIBE
si-list or UNSUBSCRIBE si-list-digest, for more help, put HELP.
si-list archives are accessible at http://www.qsl.net/wb6tpu
****

About this list Date view Thread view Subject view Author view

This archive was generated by hypermail 2b29 : Tue May 08 2001 - 14:29:32 PDT